Experimentation objectives and subjects:
1Watch diffraction phenomena of thin wire, grating, double slit, single slit, multi-slit, pinhole, measure optic intensity.
2Relation of optic intensity, wave length and slit width.
3Grating equation, Heisenberg uncertainty principle, Babinet principle.

Equipment characteristic:
1Optical detector: 12 stop filter, aperture is circular or slit. Circular dia is 0.5 1.0 2.0 3.0 4.0 5.0 mm; Slit width is 0.1 0.2 0.4 0.8 1.2mm.
2Slit accessories: Thin wire, grating, double slit, single slit, multi-slit, pinhole, etc.
3one dimensional displacement stage: Transvers displacement is 0.02mm, diplacement range≥ 100mm.

Equipment system:
Optical rails, semiconductor laser, laser power indicator, one dimensional displacement stage, optical detectors, etc.